Atomic Force Microscopy Explained: Essential Principles You Must Know (2026)
Introduction to Atomic force microscopy The microscopic technology which is used to observe and measure the surface topography of the materials with greater resolution and accuracy is Atomic force microscopy (AFM). The major limitations of the Scanning tunneling microscope (STM)...
Stylus Profilometer: The Ultimate Tool for Accurate Surface Topography 2025
Introduction of the Stylus profilometer Analyzing the material's surface characteristics with precision is very important for mechanical component parts and there are various techniques that are sophisticated and precise. There are various 2D and 3D surface profilometers and optical measurements...
Scanning Electron Microscope (SEM): Principles, 6 Components & Powerful Applications
Introduction to Scanning Electron Microscope (SEM) A Scanning Electron Microscope (SEM) is an advanced microscopy tool that overcomes the resolution limits of optical microscopes by using electrons instead of light. SEM have been commercialised for about 40 years; since then,...
X-Ray Diffraction: Comprehensive Guide & Applications (2025)
Introduction of X-ray diffraction Materials characterization ion is one of the important aspects of the material science field and there are various techniques for analyzing and identifying the material and its composition. One of the techniques which use the principle...
